Exploring Optics of Beetle Cuticles with Mueller-matrix Ellipsometry
نویسندگان
چکیده
منابع مشابه
ellipsometry and Mueller matrix polarimetry
We characterized two samples consisting of photoresist layers on silicon with square arrays of square holes by spectroscopic ellipsometry (SE) and Mueller matrix polarimetry (MMP). Hole lateral dimensions and depths were determined by fitting either SE data taken in conventional planar geometry or MMP data in general conical diffraction configurations. A method for objective determination of th...
متن کاملSum decomposition of Mueller-matrix images and spectra of beetle cuticles.
Spectral Mueller matrices measured at multiple angles of incidence as well as Mueller matrix images are recorded on the exoskeletons (cuticles) of the scarab beetles Cetonia aurata and Chrysina argenteola. Cetonia aurata is green whereas Chrysina argenteola is gold-colored. When illuminated with natural (unpolarized) light, both species reflect left-handed and near-circularly polarized light or...
متن کاملMueller matrix ellipsometry studies of nanostructured materials
Materials can be tailored on the nano-scale to show properties that cannot be found in bulk materials. Often these properties reveal themselves when electromagnetic radiation, e.g. light, interacts with the material. Numerous examples of such types of materials are found in nature. There are for example many insects and birds with exoskeletons or feathers that reflect light in special ways. Of ...
متن کاملMueller matrix interpolation in polarization optics.
The question of the physical significance of the Mueller matrix average is addressed by means of an analysis of interpolation processes. We draw a comparison between two interpolation processes. The first one is related to the classical Euclidean metrics and the second one is based on the log-Euclidean metrics. Both the associated interpolation procedures are depicted with their underlying phys...
متن کاملApplication of spectroscopic ellipsometry and Mueller ellipsometry to optical characterization.
This article provides a brief overview of both established and novel ellipsometry techniques, as well as their applications. Ellipsometry is an indirect optical technique, in that information about the physical properties of a sample is obtained through modeling analysis. Standard ellipsometry is typically used to characterize optically isotropic bulk and/or layered materials. More advanced tec...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: Materials Today: Proceedings
سال: 2014
ISSN: 2214-7853
DOI: 10.1016/j.matpr.2014.09.016